Fault Detection at Minimization of Multiple Output Function of Reed-Muller Canonical form in Logical Networks

The paper presents the structure of reed –Muller and generalized Reed-Muller transform metrics is discuss. Easily testable design techniques offer an attractive method by simplification of the test procedure as well as test data compression and hence they are in variably use in hence digital system reliability by incorporating fault tolerant/fail safe features. The detection of fault is an important prime consideration in development of testing schemes and it has significant impact on the requirements of building/self test hardware overhead and computational complexities as well as testing time. Therefore, the selections of fault detection technique become critical for complex circuits/systems particularly in situations where the fault in multiple output functions to be detected simultaneously.